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Other U.S. Government
Advanced Design Application and Data Analysis for Field XRF Instrumentation in Soil Matrices
Hosted by U.S. EPA
Technology Innovation and Field Services Division, Technology Information and Integration Branch

This course covers material that generally is not presented in XRF presentations or training courses. This is an applications course: how can a FP-XRF be used so that its data are highly dependable and defensible. Sampling design and sample handling options for FP-XRF will be covered, along with the benefits and limitations of each. Analytical and QC concerns common to using XRF are also discussed. This course will be of interest to staff developing XRF sampling and analysis plans, reviewing the plans for quality assurance, field operators, and users of XRF data for making project decisions.

Seminar Synopsis
  • Sampling considerations for XRF: data representativeness and extrapolating results to make decisions
  • Measurement support
  • Sample support
  • Decision support
  • Particle size effects
  • Options for sample preparation and handling
  • XRF Calibration and QC: what kind and& how much do you need
  • Calibration options and why choose one over another
  • “Standards” vs. “control samples”
  • NIST reference materials: uses and limitations
  • How do I know when the XRF isn’t working right?
  • Establishing XRF comparability to fixed lab methods
  • What if the methods are not measuring the same things?
  • Data comparability vs. decision comparability
  • “Collaborative” data sets to achieve decision-quality (definitive) data
  • Decision-making aids
  • Regression analysis
  • Non-parametric optimization of decision error rates
  • GeoBayesian approach to add statistical rigor to a conceptual site model (CSM)
  • Using XRF’s dynamic/adaptive capability to speed up projects
Concepts and practice will be illustrated using experiences from actual field projects.

The capabilities of newer FP-XRF instruments will be described. A CD and course handout will be provided. The CD will provide example Excel-based control charts. Important Notice: Due to the content presented during a CEC course and the restrictions in place for non-citizens to enter federal buildings, international attendees are not permitted to attend CEC courses.

For general information contact Carolyn Pitera (Tetra Tech EM, Inc. by telephone at 703-390-0621 or via e-mail at

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Bullet  Philadelphia, PA
  June 17, 2009 - June 17, 2009
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